Partial densities of states and chemical shifts in the system a-SiOx:H (0 ≤ x ≤ 2.2)
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. SiK-emission bands of hydrogenated SiOxalloys
2. X-ray emission study of amorphous SiOx:H films (0 ⩽ x ⩽ 2.2)
3. Effects of disorder on electronic structures ofa-Si:H anda-SiO2
4. X-ray emission bands and electronic structure of crystalline and vitreous silica (SiO2)
5. X-ray spectroscopic investigation of the electronic structure of α-quartz and stishovite (SiO2)
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1. MINDO/3 calculation of the electronic structure of silicon nitride;Physics of the Solid State;1997-08
2. Electronic Structure of Amorphous Insulators and Semiconductors by X-Ray Photoelectron and Soft X-Ray Spectroscopies;Amorphous Insulators and Semiconductors;1997
3. X-ray Ge K bands of Bi-Ge-S and Sb-Ge-S glasses;Journal of Physics: Condensed Matter;1993-08-09
4. Electronic structure of amorphousSiOx:H alloy films studied by x-ray emission spectroscopy: SiK, SiL, and OKemission bands;Physical Review B;1993-03-15
5. PECVD silicon oxides as studied by XPS, RBS, ERDA, IRS and ESR;Applied Surface Science;1993-03
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