Quantitative analysis of surface topography using scanning electron microscopy-Reference-Cited by-同舟云学术

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Quantitative analysis of surface topography using scanning electron microscopy

Published:1992-03 Issue:1 Volume:153 Page:119-133
ISSN:0043-1648
Container-title:Wear
language:en
Short-container-title:Wear

Author:

Myshkin N.K.,Grigoriev A.Ya.,Kholodilov O.V.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics

Reference23 articles.

1. Measurement and Analysis of Surface Roughness, Waviness, and Noncircularity;Dunin-Berkovskii,1978

2. Surface topography as a non-stationary random process;Sayles;Nature (London),1978

3. Surface Quality and Contact of Machine Parts;Demkin,1981

4. Mathematical-statistical description of ground surfaces;Linnik;Inzh. Zb. SSSR,1954

5. Random process model of rough surfaces;Nayak;ASME J. Lubr. Technol.,1971

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