High-resolution transmission electron microscopy study of interface structure and strain in epitaxial β-FeSi2 on Si (111) substrate
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference36 articles.
1. Optical properties of semiconducting iron disilicide thin films
2. Photoconductivity inn-type β-FeSi2single crystals
3. Optical properties of semiconducting iron disilicide thin films
4. Structural properties of ion‐beam‐synthesized β‐FeSi2in Si(111)
5. Origin and perspectives of the 1.54 μm luminescence from ion-beam-synthesized β-FeSi2 precipitates in Si
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