High-temperature crystallization and X-ray characterization of Y2SiO5, Y2Si2O7 and LaBSiO5-Reference-Cited by-同舟云学术

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High-temperature crystallization and X-ray characterization of Y2SiO5, Y2Si2O7 and LaBSiO5

Published:1999-09 Issue:3 Volume:205 Page:361-367
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Leonyuk N.I.,Belokoneva E.L.,Bocelli G.,Righi L.,Shvanskii E.V.,Henrykhson R.V.,Kulman N.V.,Kozhbakhteeva D.E.

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference17 articles.

1. Growth and characterization of pure Cr; Cr,Er and Cr,Ho codoped Y2SiO5

2. Laser performance of Cr4+:Y2SiO5

Cited by 37 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Insights into opto-electronic investigation of highly pure reddish-orange light emissive Sm3+ doped Y2Si2O7 phosphors: Tailored for NUV-excitable white light emitting diodes;Journal of Molecular Structure;2024-10

2. Theoretical Prediction of Thermal Expansion Anisotropy for Y2Si2O7 Environmental Barrier Coatings Using a Deep Neural Network Potential and Comparison to Experiment;Materials;2024-01-05

3. Triple-Wavelength Lasing with a Stabilized β-LaBSiO₅:Nd³⁺ Crystal;Journal of the American Chemical Society;2022-06-09

4. Near-infrared broadband emission from glass-clad Cr-doped yttrium orthosilicate crystal fiber;Optical Materials Express;2021-02-08

5. Anisotropy and phonon modes from analysis of the dielectric function tensor and the inverse dielectric function tensor of monoclinic yttrium orthosilicate;Physical Review B;2018-04-17

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