Modeling ion bombardment induced submicron-scale surface roughening
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference12 articles.
1. Submicron-scale surface roughening induced by ion bombardment
2. Scanning tunneling microscopy observation of self-affine fractal roughness in ion-bombarded film surfaces
3. Numerical solution of a continuum equation for interface growth in 2+1 dimensions
4. Universality in surface growth: Scaling functions and amplitude ratios
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