Author:
King B.V.,Puranik S.G.,MacDonald R.J.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
6 articles.
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1. Evolution of Zr/Hf/Zr trilayers during annealing studied by RBS;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-06
2. On-line study of ion beam induced mixing at interface by swift heavy ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-07
3. Simulation of interface broadening of sputter profiled isotopic silicon layers;Radiation Effects and Defects in Solids;1994-07
4. The ultimate depth resolution in SIMS profiling: low-energy ion beam mixing of AuPt interface;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-06
5. A secondary‐ion‐mass‐spectrometry study of low‐energy ion‐beam mixing of Au‐Pt interfaces;Journal of Applied Physics;1992-12-15