Elastic recoil detection analysis with atomic depth resolution

Author:

Dollinger G.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference8 articles.

1. Proc. High Energy and Heavy Ion Beams in Materials Analysis Workshop,1989

2. High resolution depth profiling of light elements

3. G. Dollinger, M. Boulouednine, T. Faestermann, P. Maier-Komor and H.-J. Körner, to be published in Radiat. Erf. Def. Sol.

4. The ion optical properties of the Munich Q3D-spectrograph investigated by means of a special experimental ray tracing method

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