Complementarity of RBS, PIGE and PIXE for the determination of surface layers of thicknesses up to 30 microns
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference16 articles.
1. Algorithms for the rapid simulation of Rutherford backscattering spectra
2. A comparison between pixe and rbs thin film thickness measurements in binary targets
3. Multilayer pixe analysis
4. Depth profiling in surface regions of oxidized metal alloys by low energy PIXE
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