Thick target yields for determination of thin target pixe efficiency-Reference-Cited by-同舟云学术

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Thick target yields for determination of thin target pixe efficiency

Published:1990-04 Issue:1-4 Volume:49 Page:138-140
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Budnar M.,Šmit Ž.,Kump P.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference11 articles.

1. New Uses of Ion Accelerators;Cahill,1975

2. Precision of PIXE analysis of thin fluid-residue specimens using internal standards

3. Calibration and long-term stability of a PIXE set-up

4. Accurate calibration of a Si(Li) detector for PIXE analysis

5. Experimental and theoretical calibration of a PIXE setup for K and L X-rays

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Efficiency calibration of a Ge(In) semiconductor detector by thin- and thick-arget PIXE;X-Ray Spectrometry;1994-03

2. Quantitative PIXE analysis using a scanning proton microbeam;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1991-04

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