Interface observation using medium energy ion scattering with high energy resolution
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
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Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. High depth resolution analysis of “5 × 5” structure with medium energy ion scattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03
2. Effect of hydrogen on Cu formation on Si(111);Surface Science;1997-04
3. SURFACE STRUCTURES AND GROWTH MODES FOR Cu ON Si(100), (110) AND (111) SURFACES DEPENDING ON Cu SEGREGATION BY HEAT TREATMENT;Surface Review and Letters;1996-06
4. Surface structures and growth mode of the surface depending on heat treatment;Surface Science;1995-08
5. Surface structure of Cu/Si(111) at high temperature;Surface Science;1995-07
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