RBS analysis of front contacts for surface-barrier detectors

Author:

Stojanović M.S.,MilosavljeviĆ M.,Subotić K.M.,Boreli F.,Wilson I.H.,Novković D.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Characterization of As Implanted Silicides by Frequency Noise Level Measurements;Materials Science Forum;1998-05

2. Characteristics of large area silicon surface barrier detectors;Thin Solid Films;1997-03

3. Frequency noise level of As ion implanted TiNTiSi structures;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-07

4. Ion implanted silicides studies by frequency noise level measurements;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-05

5. Ion implanted suicides studies by frequency noise level measurements;Ion Beam Processing of Materials and Deposition Processes of Protective Coatings;1996

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