Author:
Stojanović M.S.,MilosavljeviĆ M.,Subotić K.M.,Boreli F.,Wilson I.H.,Novković D.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
5 articles.
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1. Characterization of As Implanted Silicides by Frequency Noise Level Measurements;Materials Science Forum;1998-05
2. Characteristics of large area silicon surface barrier detectors;Thin Solid Films;1997-03
3. Frequency noise level of As ion implanted TiNTiSi structures;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-07
4. Ion implanted silicides studies by frequency noise level measurements;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-05
5. Ion implanted suicides studies by frequency noise level measurements;Ion Beam Processing of Materials and Deposition Processes of Protective Coatings;1996