Author:
Osipowicz Thomas,Corts Thilo,Lieb Klaus-Peter,Bergmeister Franz-Josef
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
11 articles.
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1. Analysis of photon emission induced by light and heavy ions in time-of-flight medium energy ion scattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-02
2. Low energy PIXE: advantages, drawbacks, and applications;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09
3. Thickness measurement of titanium nitride layers on steel using PIXE and proton backscattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-03
4. Xenon ion beam mixing in Ni3N/Al bilayers;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-05
5. Ion beam induced modifications of TiN and Ti films on Al-3% Mg substrates;Applied Physics A Solids and Surfaces;1992-01