Secondary electron emission from metal surfaces by ion impact

Author:

Kaneko Toshiaki

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference15 articles.

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Secondary Electron Generation in the Helium Ion Microscope: Basics and Imaging;Helium Ion Microscopy;2016

2. Secondary electron emission spectra and energy selective imaging in helium ion microscope;SPIE Proceedings;2011-05-13

3. Theoretical study on the role of bound electron in backward secondary electron emission induced by He+ incident on solid surfaces;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-05

4. Backward Secondary Electron Emission Yield of Thick Targets Induced by MeV Ions;Chinese Physics Letters;2000-09-01

5. Charge-state dependence of the forward/backward secondary electron yields from carbon foils induced by MeV oxygen ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-07

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