Author:
Klein S.S.,Mutsaers P.H.A.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
7 articles.
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1. Ion optical study of a transmission ion microscope;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-09
2. A new approach to nuclear microscopy: the ion–electron emission microscope;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-09
3. Structural and electrical characterisation of semiconductor materials using a nuclear microprobe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03
4. Imaging with high velocity focused ion beams;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-09
5. Subnanosecond timing with semiconductor position sensitive detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1991-12