Author:
Vis R.D.,van Langevelde F.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
10 articles.
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1. Focusing of MeV ion beams by means of tapered glass capillary optics;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2003-09
2. An optimized set-up for total reflection particle induced X-ray emission;Spectrochimica Acta Part B: Atomic Spectroscopy;1997-07
3. Glancing incident MeV ion beams for total reflection PIXE (TPIXE) and RBS surface analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-06
4. Total reflection PIXE (TPIXE) and RBS for surface and trace element analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04
5. Total reflection PIXE (TPIXE) and RBS for surface analysis;X-Ray Spectrometry;1995-03