Author:
Hnatowicz V.,Havránek V.,Kvítek J.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
11 articles.
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1. Depth distribution and diffusion behavior of implanted Bi+ ions into KTiOPO4;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2002-03
2. Depth distribution of rare earth ions implanted into KTiOPO4 determined by the Rutherford backscattering technique;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-11
3. On anomalous concentration depth profiles of atoms implanted into polymers;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03
4. Pile-up suppression in backscattering spectrometry using particle identification technique;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04
5. Determination of the lateral spread of Xe ions in silicon nitride and hydrated silicon nitride films by oblique incidence Rutherford backscattering;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1996-01