Heavy ion RBS analysis of strained layer superlattices

Author:

Yang Q.,O'Connor D.J.,Fang Z.,Ophel T.R.,Hay H.J.,Jackman T.E.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference39 articles.

1. Backscattering Spectrometry;Chu,1978

2. Rutherford backscattering with heavy ions

3. Application of heavy ions to high depth resolution RBS

4. Proc. High Energy and Heavy Ion Beams in Materials Analysis;Weller,1990

5. Comparison of back-scattering parameters using high energy oxygen and helium ions

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3. Determination of the optimum experimental conditions for enhanced depth resolution in RBS using He ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-01

4. Theoretical approximations for depth resolution calculations in IBA methods;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-05

5. Ion scattering from 0.1 keV to 10 MeV: A brief review;Mikrochimica Acta;1995-03

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