Study of multilayers by PIXE technique. Application to paintings

Author:

Brissaud Ivan,Lagarde Gérard,Midy Pierre

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference16 articles.

1. External proton beam analysis of organic and inorganic art objects

2. Proc. 4th Intern. Conf. on Non-destructive Testing of Works of Arts;Wagner,1994

3. Proc. 4th Intern. Conf. on Non-destructive Testing of Works of Arts;Wagner,1994

4. Nondestructive pigment analysis in paint layers using ion-beam methods on air

5. J. Leroux and T.P. Thinh, Corporation Scientifique Claisse, Quebec, Canada (1977).

Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. High energy PIXE: A tool to characterize multi-layer thick samples;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-02

2. Particle-Induced X-Ray Emission (PIXE);Encyclopedia of Analytical Chemistry;2016-12-21

3. PIXE analysis of historical paintings: Is the gain worth the risk?;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-11

4. A deep view in cultural heritage—confocal micro X-ray spectroscopy for depth resolved elemental analysis;Applied Physics A;2011-11-30

5. Particle-Induced X-Ray Emission (PIXE);Encyclopedia of Analytical Chemistry;2009-09-15

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