Author:
McConville C.F.,Noakes T.C.Q.,Sugden S.,Hucknell P.K.,Sofield C.J.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Ion-beam characterization in superlattices;Handbook of Thin Films;2002
2. High depth resolution Rutherford backscattering analysis of Si–Si0.78Ge0.22/(001)Si superlattices;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-04
3. A fast beam deflection system for the application in a time of flight spectrometer;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03