Author:
Wien K.,Koch Ch.,Nguyen van Tan
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
30 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Search for short-time phase effects in the electronic damage evolution – A case study with silicon;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-04
2. Effects of projectile track charging on the H− secondary ion velocity distribution;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-03
3. Secondary ion emission dynamics model: A tool for nuclear track analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-04
4. Track electrostatic model for describing secondary ion emission of insulators;Brazilian Journal of Physics;2005-12
5. Erratum to “Femtosecond dynamics – snapshots of the early ion-track evolution” [Nucl. Instr. and Meth. B 225/1–2 (2004) 4–26];Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-12