Author:
Döbeli M.,Haubert P.C.,Livi R.P.,Spicklemire S.J.,Weathers D.L.,Tombrello T.A.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
10 articles.
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2. Thin Film Characterisation Using MeV Ion Beams;Ion Beams in Nanoscience and Technology;2009
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4. Medium energy ion-nanoprobe with TOF-RBS for semiconductor process analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-05
5. Influence of heavy ion irradiation damage on silicon charged particle detector calibration;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2000-03