High-resolution analysis of protons scattered from solid surfaces-Reference-Cited by-同舟云学术

High-resolution analysis of protons scattered from solid surfaces

Published:1990-01 Issue:1-4 Volume:45 Page:412-415
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Matsunami Noriaki,Kitoh Kenshin,Kanasaki Jun-ichi,Itoh Noriaki

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference18 articles.

2. Fundamentals of Surface and Thin Film Analysis;Feldman,1986

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A study of carbon thin films by ion beams with high energy resolution;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-06

2. Surface studies with high-energy ion beams;Reports on Progress in Physics;1992-07-01

3. Impact parameter dependent electronic stopping for low velocity heavy ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-04

4. A computer study of the energy loss spectrum of 100 keV H+ at a W(111) surface;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1990-01