The use of an electron beam ion trap in the study of highly charged ions-Reference-Cited by-同舟云学术

The use of an electron beam ion trap in the study of highly charged ions

Published:1989-09 Issue:3 Volume:43 Page:431-440
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Levine M.A.,Marrs R.E.,Bardsley J.N.,Beiersdorfer P.,Bennett C.L.,Chen M.H.,Cowan T.,Dietrich D.,Henderson J.R.,Knapp D.A.,Osterheld A.,Penetrante B.M.,Schneider M.B.,Scofield J.H.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference23 articles.

1. The Electron Beam Ion Trap: A New Instrument for Atomic Physics Measurements

2. Electron beam ion sources and associated physics at JINR

3. MULTIPLE IONIZATION OF THE RARE GASES BY SUCCESSIVE ELECTRON IMPACTS (0–250 eV): I. APPEARANCE POTENTIALS AND METASTABLE ION FORMATION

4. Review of the JINR Electron Beam Ion Sources

5. Proc. Int. Symp. on EBIS and their applications,1988

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