Atomic physics studies of highly charged ions on tokamaks using X-ray spectroscopy-Reference-Cited by-同舟云学术

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Atomic physics studies of highly charged ions on tokamaks using X-ray spectroscopy

Published:1989-09 Issue:3 Volume:43 Page:347-358
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Beiersdorfer P.,von Goeler S.,Bitter M.,Hill K.W.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference90 articles.

1. Soft-X-ray spectroscopic diagnostics of laboratory plasmas

2. Doppler-Broadening Measurements of X-Ray Lines for Determination of the Ion Temperature in Tokamak Plasmas

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