High resolution PIXE using different orders of reflection, Part II-Reference-Cited by-同舟云学术

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High resolution PIXE using different orders of reflection, Part II

Published:1993-06 Issue:1-4 Volume:79 Page:413-414
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Török I.,Bondár T.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference5 articles.

1. The Mg/Ca ratio determination by high resolution PIXE

2. Proc. 2nd ECAART Conf.;Török,1992

3. X-Ray Emission and Absorption Wavelengths and Two-Theta Tables;White,1970

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-Ray Spectrometry;Analytical Chemistry;1994-06-01

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