Quantitative texture and defect analysis of polycrystalline diamond films by ion channeling-Reference-Cited by-同舟云学术

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Quantitative texture and defect analysis of polycrystalline diamond films by ion channeling

Published:1994-04 Issue:3-4 Volume:86 Page:339-344
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Samlenski R.,Brenn R.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference13 articles.

1. Characterization of polycrystalline layers by channelling measurements

2. Separate estimate of crystalline orientations and scattering centers in polycrystals by backscattering technique

3. A structure modeling of metal-silicide layers by using axial and planar channeling techniques

4. Ion channeling in textured polycrystalline diamond films

5. R. Samlenski, G. Flemig, R. Brenn, C. Wild, W. Müller-Sebert and P. Koidl, Diamond and Related Materials, in press.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Observation of channeling effects for relativistic electrons in a polycrystal;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-07

2. Search for channeling effects in a polycrystal;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-09

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