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Computer simulation of ion beam methods in analysis of thin films

  • Published:1994-05 Issue:1-4 Volume:89 Page:122-130
  • ISSN:0168-583X
  • Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  • language:en
  • Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Vizkelethy György

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference65 articles.

1. Backscattering Spectrometry;Chu,1978

2. Ion Beam Handbook for Materials Analysis,1977

3. Elemental Analysis by Particle Accelerators,1992

4. The Stopping and Range of Ions in Solids;Ziegler,1985

5. A deconvolution technique for depth profiling with nuclear microanalysis

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1. Non-classical applications of chemical analysis based on nuclear activation;Journal of Radioanalytical and Nuclear Chemistry;2019-12-05

2. Nuclear Reaction Analysis (NRA) and Particle-Induced Gamma-Ray Emission (PIGE);Characterization of Materials;2012-10-12

3. Intelligent methods for solving inverse problems of backscattering spectra with noise: a comparison between neural networks and simulated annealing;Neural Computing and Applications;2008-12-03

4. RBF neural networks for solving the inverse problem of backscattering spectra;Neural Computing and Applications;2007-07-17

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