Investigation of silicon width (p, ṕ) resonance scattering in 〈110〉 channeling direction

Author:

Ditrói F.,Meyer J.D.,Michelmann R.,Kislat D.,Bethge K.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference14 articles.

1. Materials Analysis by Ion Channeling;Feldman,1982

2. Ion Beams for Materials Analysis;Bird,1989

3. High Energy Ion Beam Analysis of Solids;Götz,1988

4. Study of the lattice location of oxygen in semiconductors by combining channeling and charged particle activation

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Investigation of charge-state modifications under channeling conditions by highly charged heavy projectiles;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2000-03

2. Application of the Combined Channeling Method at Higher Ion Energies on Cyclotron;Materials Science Forum;1997-05

3. Computer simulation of channeling in Si and GaAs crystals;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-05

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