Microscopic characterization of materials by ion beam and hyperfine interaction analysis-Reference-Cited by-同舟云学术

Microscopic characterization of materials by ion beam and hyperfine interaction analysis

Published:1992-02 Issue:1-4 Volume:64 Page:215-220
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Soares J.C.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference16 articles.

1. Fundamentals of Surface and Thin Film Analysis;Feldman,1986

2. Microscopic Methods in Metals;Wiehert,1986

3. Nuclear Physics Applications on Materials Science;Vianden,1988

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

4. Mass spectrometry improvement on an high current ion implanter;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-12

5. High precision 180Hf ion implantation using a high-current ion implanter;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-08