Microscopic characterization of materials by ion beam and hyperfine interaction analysis

Author:

Soares J.C.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference16 articles.

1. Fundamentals of Surface and Thin Film Analysis;Feldman,1986

2. Microscopic Methods in Metals;Wiehert,1986

3. Nuclear Physics Applications on Materials Science;Vianden,1988

4. Oxygen gettering by hafnium implanted in beryllium: A 〈0001〉 Hf‐O dumbbell?

5. Quadrupole interaction at Ta and lattice location of Hf in Be

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