Surface and adsorbate structural analysis from time-of-flight scattering and recoiling spectrometry (TOF-SARS)
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference36 articles.
1. Scattering and Recoiling Spectrometry: An Ion's Eye View of Surface Structure
2. Structure Analysis of the Si(111)7 × 7 Surface by Low-Energy Ion Scattering
3. Surface structure analysis using low energy ion scattering
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5. Experimental realisation of low-energy surface channeling
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