NRA and RBS analyses of silicon, aluminium and iron nitride thin films-Reference-Cited by-同舟云学术

NRA and RBS analyses of silicon, aluminium and iron nitride thin films

Published:1992-02 Issue:1-4 Volume:64 Page:756-759
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Stedile F.C.,Hübler R.,Baumvol I.J.R.,Schreiner W.H.,Freire F.L.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference10 articles.

5. R. Hübler, S.R. Teixeira, W.H. Schreiner and U.R. Baumvol, J. Appl. Phys., to be published.

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

2. Ion beam mixing of AlAlN multilayers for tribological and corrosion protection;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-01

3. IBAD growing of magnetic iron nitride thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-01