Secondary ion generation mechanism studied by ISS-SIMS and work function measurements
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference15 articles.
1. Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectra
2. Chemical enhancement effects in SIMS analysis
3. X-ray emission from inner shell (2p) excited sputtered Al-atoms/ions resulting from Ar+ and Ne+ impact on solid Al
4. Sequential SIMS-ISS analysis of oxygen-enhanced secondary ion generation
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Study on the sputter-cleaning processes of Ni by means of Kelvin probe;Surface Science;2002-05
2. A systematic study of the characteristic velocities of the negative secondary ion emissions of H, O and matrix species from Sc, Ti, V, Co, Ni and Cu substrates;Surface Science;1996-09
3. Reconstruction of the secondary ion energy distributions of Sc−, Ti−, V−, Co−, Ni− and Cu− emitted from metal surfaces;Surface Science;1995-11
4. Oxygen enhanced secondary ion emission of Fe and Co by TOF-SIMS and ISS/DR;Surface Science;1995-02
5. Positive ion fractions of recoiled A1 and O from O-adsorbed Al surfaces by low-energy ion bombardment;Surface Science;1994-11
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