Author:
Picraux S.T.,Dawson L.R.,Tsao J.Y.,Doyle B.L.,Lee S.R.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
29 articles.
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1. Backscattering analysis of short period ZnO/MgO superlattices;Surface and Coatings Technology;2018-12
2. Radiation emission at channeling of electrons in a strained layer undulator crystal;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-08
3. Depth dependent lattice disorder and strain in Mn-implanted and post-annealed InAs thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-04
4. Atomic layer deposition of HfO2 and Al2O3 layers on 300 mm Si wafers for gate stack technology;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2011-01
5. Strain tensors in layer systems by precision ion channeling measurements;Journal of Applied Physics;2010-06-15