Secondary ion emission from ultra-thin oxide layers bombarded by energetic (MeV) heavy ions: depth of origin and layer homogeneity
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
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1. MeV ion sputtering of polymers: observation of a secondary ion emission dependence on the crystallinity of PEEK and PET films;International Journal of Mass Spectrometry and Ion Processes;1997-10
2. Elastic and inelastic processes in the interaction of 1–10 eV ions with solids: ion transport through surface layers;Surface Science Reports;1997-08
3. Transmission sputtering under diatomic molecule bombardment. Model calculations;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04
4. “Spontaneous” desorption: A controlled phenomenon for surface analysis application? Part I: New evidence for a sputtering process induced by a well localized field enhanced desorption;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-01
5. Thermooxidation-induced surface modifications of the ethylene-methyl acrylate copolymer as investigated by time-of-flight particle-induced desorption mass spectrometry .2. The copolymer;RAPID COMMUN MASS SP;1996
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