Dual-energy technique for rapid, high-sensitivity PIXE analysis of aerosol samples covering elements with atomic numbers down to Z = 13

Author:

Hietel B.,Schulz F.,Menzel N.,Tschiersch J.,Busch B.,Wittmaack K.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference6 articles.

1. Proton induced X-ray emission as a tool for trace element analysis

2. Wet deposition of aerosol: test of the method

3. F. Schulz, Poster no. 2.13 presented at this conference, Book of Abstracts, p. 42; to be published.

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A spray technique for preparing uniform large-area PIXE calibration standards from aqueous solutions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-04

2. A new analysis chamber with a rotating target holder for total-sample PIXE analysis of aerosol deposits collected in Berner impactors;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-04

3. Identification of an unusual source of background signals in energy dispersive PIXE analysis — A detective story;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03

4. RBS control of the proton fluence in external PIXE analysis using a He atmosphere;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04

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