Author:
Cowern N.E.B.,Read P.M.,Sofield C.J.,Bridwell L.B.,Huxtable G.,Miller M.,Lucas M.W.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
30 articles.
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2. Damage induced by high energy multiply charged oxygen ions in oxide coated silicon;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-03
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