The physics of electron beam ion sources-Reference-Cited by-同舟云学术

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The physics of electron beam ion sources

Published:1991-05 Issue: Volume:56-57 Page:239-245
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Stockli Martin P.,Cocke C.L.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference54 articles.

1. USSR Inventor's Certificate No. 248860 (1967);Donets;Byull. OIPOTZ No. 23,1969

2. M.P. Stockli, accepted for publication in Z. Phys. D.

3. Ion-collision experiments with slow, very highly charged ions extracted from an electron-beam ion trap

4. The Physics and Technology of Ion Sources;Donets,1989

5. Int. Conf. on Ion Sources;Donets,1989

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Room-temperature EBIS/T developments: past, present and future;Journal of Instrumentation;2010-11-09

2. Production of microbunched beams of very highly charged ions with an electron beam ion source;Review of Scientific Instruments;1998-02

3. Analog gain of microchannel plates for 1.5–154 keV/q Arq+(3⩽q⩽16);Review of Scientific Instruments;1997-08

4. Production, operation and status of the KSU CRYEBIS facility;Physica Scripta;1997-01-01

5. Slow expulsions and temperature measurements of highly charged ions from electron beam ion sources;Physica Scripta;1997-01-01

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