The calculation of PIXE minimum yields using RBS channelling-Reference-Cited by-同舟云学术

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The calculation of PIXE minimum yields using RBS channelling

Published:1991-11 Issue:1 Volume:62 Page:133-138
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Breese M.B.H.,King P.J.C.,Romano L.T.,Grime G.W.,Watt F.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference20 articles.

1. Channelling Theory, Observation and Applications,1973

2. Materials Analysis by Ion Channelling;Feldman,1982

3. Backscattering Spectrometry;Chu,1978

4. A study of hydrogen implanted in aluminium

5. PIXE — A Novel Technique for Elemental Analysis;Johanssen,1988

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Defect development and dopant location due to elevated temperature implantation of InP with MeV zinc ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-06

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