Three-dimensional microanalysis using a focused MeV oxygen ion beam-Reference-Cited by-同舟云学术

Three-dimensional microanalysis using a focused MeV oxygen ion beam

Published:1991-03 Issue:1-3 Volume:54 Page:269-274
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Horino Y.,Chayahara A.,Satou M.,Takai M.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference13 articles.

1. Proc. 6th Int. Conf. on Ion Beam Modification of Materials,1989

2. Proc. 7th Int. Conf. on Ion Implantation Technology,1989

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2. Application of heavy-ion RBS to compositional analysis of thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03

3. A history of ion microbeams;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07

4. Analysis of iron by PIXE using heavy ion microprobes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-09

5. Submicron microbeam apparatus using a single-ended accelerator with very high voltage stability;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-09