The use of coincidence counting mass spectrometry to study the emission and metastable dissociation of cluster ions
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference16 articles.
1. Developments in secondary ion mass spectroscopy and applications to surface studies
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3. Coincidence Counting in Time-of-Flight Mass Spectrometry: A Test for Chemical Microhomogeneity
4. Analysis of polystyrene/PVME blends by coincidence counting time-of-flight mass spectrometry
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1. Characterization and quantification of biological micropatterns using cluster SIMS;Surface and Interface Analysis;2010-05-11
2. Determination of the metastable dissociation pathways for chromium/oxygen cluster ions sputtered from potassium chromate and dichromate using the ion-neutral correlation method;International Journal of Mass Spectrometry;2000-12
3. Secondary cluster ion emission from megaelectron volts ion impacts on NaBF4. 1. Ion decay fractions and dissociation pathways;International Journal of Mass Spectrometry;2000-10
4. Speciation of Sodium Nitrate and Sodium Nitrite Using Kiloelectronvolt Energy Atomic and Polyatomic and Megaelectronvolt Energy Atomic Projectiles with Secondary Ion Mass Spectrometry;Analytical Chemistry;2000-04-27
5. Ion-neutral correlations from the dissociation of metal oxide cluster ions in a reflectron time-of-flight mass spectrometer;J MASS SPECTROM;1999
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