Author:
Kim N.B.,Woo H.J.,Kim D.K.,Choi H.W.,Lee K.Y.,Park K.S.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
3 articles.
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1. Precise analysis of PIXE induced XRF spectra with the aid of the Raman scattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04
2. Analysis by absorption and scattering of radiation;Journal of Radioanalytical and Nuclear Chemistry Articles;1994-12
3. PIXE-induced XRF analysis for trace amounts of Mn, Cr, V and Ti in low-alloy steels;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-11