Electron intensities obtained during backscattered-Mössbauer spectroscopy
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference16 articles.
1. Depth selection by means of scattered electrons: A method to determine electron line profiles
2. Depth selective Mössbauer-effect measurements by means of scattered electrons
3. A simple method for the analysis of depth-selective Mössbauer-effect measurements
4. An empirical method of quantitative analysis in depth-selective me-spectroscopy
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1. A novel type of depth-selective Auger electron Mössbauer spectroscopy;Hyperfine Interactions;1990-07
2. Mössbauer spectroscopy and surface scattering of electrons;Hyperfine Interactions;1990-07
3. Angular and energy distributions of low energy electrons from backscattered-conversion electron Mössbauer spectroscopy;Hyperfine Interactions;1990-07
4. Phase determination and spatial distribution of an ion‐beam mixed internal interface: Fe/Sn;Journal of Applied Physics;1990-03-15
5. Angular and energy distributions of low energy electrons in backscattered-Mössbauer spectroscopy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1989-11
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