Latent (sub-surface) tracks in mica studied by tapping mode scanning force microscopy
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference32 articles.
1. Scanning electron microscope analysis of etch pits obtained in a Muscovite mica track detector by etching in hydrofluoric acid and aqueous solutions of NaOH and KOH
2. Dependence of etch pit cone angles in glass track detectors on the energy and charge of the particles
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4. The AFM as a tool for surface imaging
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1. Impact Features Induced by Single Fast Ions of Different Charge-State on Muscovite Mica;Atoms;2021-02-25
2. Dynamic evolutions of swift heavy ion induced latent tracks under electron bombardment from TEM;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-08
3. High resolution AFM studies of irradiated mica—following the traces of swift heavy ions under grazing incidence;Journal of Physics: Condensed Matter;2018-06-18
4. The nanostructure formation on muscovite mica surface induced by intermediate-energy ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-07
5. Scanning force microscopy of 129Iodine surface impact structures in muscovite, zircon and apatite as proxies for damage of simulated fission fragments in solids;Radiation Measurements;2013-04
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