Subject
Instrumentation,Nuclear and High Energy Physics
Reference6 articles.
1. TENNELEC Silicon Charged Particle Detectors, Selection Guide and Price List, from the TENNELEC complete catalog,1983
2. Transmission electron microscopy and Rutherford backscattering studies of different damage structures in P+implanted Si
3. presented at the 5th Perennial Carl S. Marvel Symposium;Valenty,1983
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3 articles.
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1. Measuring the depth of fluorine incorporation in high and low density polyethylene by Rutherford backscattering spectrometry;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1993-05
2. New trends in ion-beam analysis;Surface Science Reports;1992-11
3. 3S-R10 automated RBS system;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1989-04