High resolution depth profiling of nitrogen in A1N layers

Author:

Terwagne G.,Lucas S.,Bodart F.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Depth profiling of nitrogen within 15N-incorporated nano-crystalline diamond thin films;Applied Physics Letters;2013-09-23

2. Influence of nitrogen on the growth and luminescence of silicon nanocrystals embedded in silica;Journal of Applied Physics;2009-01

3. Fabrication and nuclear analysis of isotopic 14N and 15N ion-implanted silicon standards;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-05

4. Depth profiling of nitrogen using 429keV and 897keV resonances in the 15N(p,αγ)12C reaction;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-11

5. Non-destructive depth profiling of solid samples by atomic and nuclear interactions induced by charged particles;Journal of Electron Spectroscopy and Related Phenomena;2003-06

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3