Channeling charged particle activation analysis of light impurities at trace levels in GaAs-Reference-Cited by-同舟云学术

Channeling charged particle activation analysis of light impurities at trace levels in GaAs

Published:1994-05 Issue:1-4 Volume:89 Page:79-82
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Schenkel Th.,Hebert H.,Meyer J.D.,Michelmann R.W.,Bethge K.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference6 articles.

1. these Proceedings ECAART-3;Meyer,1994

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