PIXE-induced XRF with transmission geometry
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference20 articles.
1. Conference summary
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3. Trace element analysis by means of particle induced X-ray emission with triggered beam pulsing
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5. Application of PIXRF in the analysis of archaeological glazed tiles;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-11
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