XRFS and PIXE: Are they complementary or competitive techniques?
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference34 articles.
1. Analytical application of total reflection and polarized X-rays
2. X-ray fluorescence analysis in the ng region using total reflection of the primary beam
3. Sensitivity in trace-element analysis by p, α and 16O induced X-rays
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1. A review of pXRF (field portable X-ray fluorescence) applications for applied geochemistry;Journal of Geochemical Exploration;2018-05
2. Characterization and application of automated in-vacuum PIXE/EBS system for direct analysis of chloride and sulfate ions attack in cementitious materials;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-01
3. Cuban zeolite for lead sorption: application for water decontamination and metal quantification in water using nondestructive techniques;International Journal of Environmental Science and Technology;2016-03-09
4. Portable XRF as a valuable device for preliminary in situ pigment investigation of wooden inventory in the Trski Vrh Church in Croatia;Applied Physics A;2008-03-29
5. Improvements in trace element detection in energy dispersive spectrometry using an X-ray filter (FEDS) and applications to petrological problems;Microchimica Acta;2007-12-20
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