Energy distributions of hydrocarbon secondary ions from thin organic films under keV ion bombardment: Correlation between kinetic and formation energy of ions sputtered from tricosenoic acid-Reference-Cited by-同舟云学术

Energy distributions of hydrocarbon secondary ions from thin organic films under keV ion bombardment: Correlation between kinetic and formation energy of ions sputtered from tricosenoic acid

Published:1996-09 Issue:3 Volume:117 Page:235-242
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Delcorte A.,Bertrand P.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference29 articles.

1. Proc. ICACS 16;Delcorte,1996

2. Mechanisms in molecular SIMS

3. Chemical reactions induced in polymers by keV ions, electrons and photons

4. Secondary molecular ion emission from aliphatic polymers bombarded with low energy ions: Effects of the molecular structure and the ion beam induced surface degradation

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ion yield enhancement at the organic/inorganic interface in SIMS analysis using Ar-GCIB;Applied Surface Science;2021-01

2. Mechanistic Insight into Gas Cluster-Induced Sputtering of Kilodalton Molecules Using Kinetic Energy Distribution Measurements;The Journal of Physical Chemistry C;2019-07-15

3. TOF-SIMS: Accurate mass scale calibration;Journal of the American Society for Mass Spectrometry;2006-04-01

4. Interpretation of static secondary ion spectra;Surface and Interface Analysis;2004-03

5. Experimental Techniques;Fundamentals of Ion-Irradiated Polymers;2004