Author:
Bouwman R,Toneman LH,Holscher AA
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Cited by
26 articles.
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1. Depth Profile and Interface Analysis of Thin Films by AES and XPS;Thin Film and Depth Profile Analysis;1984
2. Quantitative Auger Electron Spectroscopy;Advances in Electronics and Electron Physics Volume 61;1983
3. Surface analysis with Auger electron spectroscopy;Applications of Surface Science;1982-08
4. Fundamentals and Applications of Auger Electron Spectroscopy;Advances in Electronics and Electron Physics;1980
5. Advances in and Quantification of Auger Electron Spectroscopy (AES);Electron and Positron Spectroscopies in Materials Science and Engineering;1979